Tuesday 7 November 2023 from 12:30pm to 1:30pm
Electronic devices – machines that contains billions of tiny switches called transistors – have revolutionized the way we live: from online shopping to remote working to instant access to the Internet. As these transistors are miniaturized down to the fundamental limit set by the laws of physics, localized heating in these minuscule switches can lead to an overheating or, in extreme case, a catastrophic failure. As such, there is an urgent need for metrology that can accurately identify these thermal anomalies, known as hot spots, in prototypical electronic gadgets.
Our research focuses on the development of high-resolution, non-contact thermal sensing techniques that can identify these thermal hot spots. In particular, we use optically active defect centers, aslo known as quantum emitters, in wide bandgap semiconductors such as diamond to achieve such a goal. By leveraging the temperature-dependent emission of these defect centers, we can perform real-time temperature monitoring down to the sub-micron limit – revealing the uneven thermal distribution on these microelectronic devices.
Biography
Dr Trong Toan Tran is a Lecturer (Assistant Professor) and a DECRA (previously a Chancellor Postdoctoral Research Fellow) at the School of Electrical and Data Engineering, Faculty of Engineering and Information Technology, UTS. He is a physicist and engineer with a background in Material Science and Chemical Engineering. He leads the Nanoscale Electro-Thermo-Optical laboratory (NETO) at UTS Tech Lab (www.tttranlab.com). His research interest includes quantum optics, nanophotonics, solid-state physics, thermometry and nanofabrication. Currently, Dr Tran actively researches novel quantum light sources and their applications in mapping thermal distribution in electronic circuits, nanoscale sensing, and advanced photonic technologies.